性能特点
X荧光欧盟指令ROHS卤素分析仪主要测试RoHS，同时可以分析水泥、钢铁、矿料等元素分析，
内置信噪比增强器可提高仪器信号处理能力25倍。
针对不同样品可自动切换准直器和滤光片。
电制冷UHRD探测器，摒弃液氮制冷。
智能元素分析软件，与仪器硬件相得益彰，且操作简单。
参数规格
测量元素范围：从钠（Na）至铀（U）
X荧光欧盟指令ROHS卤素分析仪元素含量分析范围：1ppm—99.99%
同时分析元素：24种元素同时分析
功能范围：水泥、钢铁、矿料等元素分析
测量对象状态：粉末、固体、液体
测量时间：60s—200s
能量分辨率为：（150±5）eV
管压：5KV—50KV
管流：50uA—1000uA
产品特点
电制冷UHRD探测器
光路增强系统
内置高清晰摄像头
可自动切换型准直器和滤光片
的升降平台
加强的金属元素感度分析器
外观尺寸： 650×608×466 mm
样品腔尺寸：315×95mm
重量：105kg
公司介绍
X荧光欧盟指令ROHS卤素分析仪利用X射线技术该技术的主要特征为：利用低能X光激发待测元素，对Si、S、Al、Na、Mg等轻元素有良好的激发效果，并且测试时间短，大大提高了检测效率和工作效率：采用UHRD探测器，具有良好的能量线性和能量分辨率，及良好的能谱特性，较高的峰背比；采用自动稳谱装置，了仪器工作的致性：利用解谱技术使谱峰分解，使采用UHRD探测器的分析仪对Si、S、AI等轻元素的测试具有好的分析精度；采用多参数的线性回归方法，使元素间的吸收、排斥效应得到明显的降低。
Instrument introduction
EDX3600B X-ray Fluorescence spectrometer uses XRF technology for rapid ａnd accurate elemental analysis of cement ａnd steel. The technology features low-energy X-rays with good excitation results of light elements such as Si, S, Na ａnd Mg. Plus, the test time is short ａnd test efficiency is greatly improved. The instrument is equipped with UHRD detector as well, which leads to good energy linearity, energy resolution, spectrum property ａnd high peak-background ratio. Due to automatic spectrum stabilizing device, the instrument is in great consistency. As spectrum decoupling technique is used, the original spectrum can be easily decoupled, ａnd the measured analytical precision of light elements of Si, S, Al, etc is the same. Owing to multi-parameter linear regression method, the absorption ａnd enhancement effects between elements are significantly reduced.
Performance characteristics
Deliver professional full-element analysis of cement, steel, minerals, plating thickness ａnd hazardous elements (RoHS).
In-built SNE improves the signal processing ability up to 25 times.
The collimators ａnd filters can be switched automatically for different samples.
Electric-cooling UHRD detector instead of liquid nitrogen cooling detector
Intelligent full-element analysis software matches with the hardware well.
Standard configurations
Electric-cooling UHRD detector
Signal-to-Noise Enhancer (SNE)
Light path enhancement system
In-built high resolution CCD
Automatic collimator ａnd filter switch
Precise mobile platform
Enhanced metal sensitivity analyzer
Technical specifications
Measurable elements: Na to U
Range of element content: 1ppm-99.99%
Ability of simultaneous analysis: 24 elements
Plating thickness measurement: more than 11 layers, up to 0.005μm each layer
Analysis accuracy: 0.05%
Forms of samples: powder, solid ａnd liquid
Measurement time: 60s—200s
Energy resolution: （150±5）eV
Tube voltage: 5KV—50KV
Tube current: 50uA—1000uA
原创作者：江苏天瑞仪器股份有限公司
